Synchrotron Radiation Techniques for Materials Characterization

    Code: CEM 174

    Credits: 05

    Elective Subject

    Contents:

    • Introduction: Synchrotron Light for Materials Science;
    • Interaction between synchrotron light with the matter;
    • Physics of synchrotron light (Brightness, Flux, Polarization, etc.);
    • Light Synchrotron beam lines;
    • X-ray Diffraction using synchrotron radiation (XRD);
    • X-ray scattering techniques: Small angle X-ray scattering (SAXS), Grazing incident small angle
    • X-ray scattering (GISAXS), X-ray reflectometry (XRR);
    • X-ray Spectrometry techniques: X-ray photoelectron spectroscopy (XPS); X-ray absorption
    • Spectroscopy (XANES and EXAFS).


    References:

    1. PHILIP WILLMOTT, An Introduction to Synchrotron Radiation -Techniques and Applications. First edition, 2011 John Wiley and Sons, Ltd.
    2. Helmut Clemens; Svea Mayer; Schreyer; Andreas P. Staron, Neutrons and synchrotron radiation in engineering materials science : from fundamentals to applications. First edition, 2017, Wiley-VCH.
    3. Scott Calvin, XAFS FOR EVERYONE, Taylor & Francis, First edition, 2013.
    4. Grant Bunker, Introduction to XAFS, Cambridge University Press, 2010.
    5. Yoshio Waseda, Eiichiro Matsubara, Konzo Shinoda. X-ray Diffraction Crystallography: Introduction, Examples and Solved problems. First Edition, 2011, Springer.