Electron Microscopy I

    Code: CEM 112

    Credits: 05

    Elective subject

    Contents:

    • Introduction;
    • Engineering of Microstructures;
    • Applications of Scanning Electron Microscopy;
    • Scanning Electron Microscopy: Electron sources (filaments and guns); Electromagnetic lenses; illumination system; Optical-electronic system in SEM; Beam-sample interaction; Signal detection; Contrast mechanisms; Resolution; Depth of focus and field;
    • Analytical Electron Microscopy: Characteristic spectrum of x-ray emission: Electron-matter interaction, Interaction volume; Energy dispersive spectroscopy (EDS); Wavelength dispersion spectroscopy (WDS); Quantitative microanalysis by x-rays: Principles and correction factors: ZAF; Microanalysis of light elements; X-ray mapping;
    • Diffraction in SEM: EBSD (electron back-scattered diffraction);
    • Sample Preparation Techniques;
    • Transmission Electron Microscopy (TEM): Transmission Electron Microscope; MET: Introduction; TEM Parts; Electrons Sources (filaments and guns); Electromagnetic lenses; illumination system; Sample; Apertures; Images Formation: Bright field (BF), dark field (DF) and electron diffraction;


    References:

    • GOLDSTEIN J.I.; NEWBURY D. E.; ECHIL P; Joy DC; Romig Jr AD; Lyman CE; Fiori C; Lifshin E. Scanning electron microscopy and X-ray microanalysis. New York: Plenum Press; 1992.
    • KESTENBAC, H.J.; BOTA FILHO W.J. Microscopia eletrônica transmissão e varredura. São Paulo: ABM, 1994.
    • PINTO, A. L..; Lopes, A. M., In Textura e relações de orientação: deformação plástica, recristalização e crescimento de grão. São Paulo: André P. Tschiptschin Ed., IPEN, 2a ed.,pp. 441-459, 2003.
    • D.B. Williams, C.B. Carter, Transmission Electron Microscopy, Plenum Press, New York, 2009.
    • L. Remier, Transmission Electron Microscopy, 4th Ed., Springer-Verlag, New York, 1997.
    • J.W. Edington, Practical Electron Microscopy in Materials Science, N.V. Philips, Eindhoven, 1976.